Australia
[photo] F601 (flat surface) Interferometer

Interferometer

Laser Interferometers

The Fujifilm laser interferometers and related equipments, which earn top share in Japan, are used for the measurement of surface profiles and wave fronts of lenses and metals on the order of nanometers.
 

Fujifilm interferometers permit practically non-contact observation, regardless of the specimen material if it has a polished mirror-like surface. We also offer an interference fringe analyze device that automatically analyze and quantify interference fringe patterns. This device can be used to create high-performance measurement systems that are highly functional and easy to use.


Our interferometer lineup is designed for a variety of purposes, including flatness measurements of precision surfaces (such as those of glass, metal, and ceramic), and precision measurements of spherical surfaces of glass or plastic lenses, steel balls, etc. Please use Fujifilm interferometers with confidence for high-precision measurements.

[photo] G102 (Flat Surface) Interferometer

Interferometers for Flatness Measurements

Fujifilm’s flat surface measurement systems have become the de facto standard in the optical industry for the measurement, on the order of nanometers, of the flatness of a variety of high-precision flat surfaces, including glasses, metals, and ceramics. They can also be used in a non-contact way for easy Pass/Fail judgments, without scratching or marking the test object.

Glasses

[image] Cut-out square of glass material drawing
  • Cover glasses (for smartphones, etc.)
  • Prisms (optical color separation systems, etc.)
  • Semiconductor mask substrates
  • Various types of filters
  • LCD glasses
[image] Good versus bad slide examples of interference fringes under interferometer

Interference fringes

Metals

[image] Cut-out square of metal material drawing
  • Metal dies and molds
  • Aluminum discs
[image] Good versus bad slide examples of interference fringes under interferometer

Interference fringes

Others

[image] Cut-out square of other materials drawing
  • Silicon wafers (for semiconductor devices)
  • Substrates for hard discs
  • Others (faucet components, etc.)
[image] Good versus bad slide examples of interference fringes under interferometer

Interference fringes

Products Measurement targets Aperture sizes Accuracy of transmission flats Magnifications

Compact Laser Interferometer F601

Flat surface / Transmitted wavefront

φ60

λ/20

×1

φ102/φ150 Laser Interferometer G102

Flat surface / Transmitted wavefront

φ102 
φ150
λ/20 ×1 - ×8.6

 

[photo] F601 (Sphere Surface) Interferometer

Interferometers for Spherical Surface Measurements

Fujifilm’s spherical surface measurement systems have become the de facto standard in the optical industry for the measurement, on the order of nanometers, of a variety of spherical surfaces, including high-precision lenses, steel balls, dies and molds.


They can also be used in a non-contact way for easy Pass/Fail judgments, without scratching or marking the test object.

Glasses

[image] Cut-out sphere of glass material drawing
  • A variety of spherical lenses
    (for digital cameras, in-vehicle lenses, security systems, sensors, contact lenses, copiers, etc.)
[image] Good versus bad slide examples of interference fringes under interferometer

Interference fringes

Metals

[image] Cut-out sphere of metal material drawing
  • Steel balls
  • Bearings
  • Molds (approx. φ60 mm maximum)
[image] Good versus bad slide examples of interference fringes under interferometer

Interference fringes

Others

[image] Cut-out sphere of other materials drawing
  • Molds for plastic lenses (contact lenses, etc.)
  • Various types of filters
[image] Good versus bad slide examples of interference fringes under interferometer

Interference fringes

Products Measurement targets Aperture sizes Accuracy of transmission flats Magnifications

Compact Laser Interferometer F601

Flat surface / Transmitted wavefront

φ60

λ/20

×1

Newton Ring Inspection Interferometer F601FC II

Flat surface / Transmitted wavefront

φ60 λ/20 ×1

 

[photo] Desktop computer with Fringe Analysis System software on screen

Fringe Analysis System

The obtained interference fringes are analyzed to achieve digital visualization of surface configurations and transmitted wavefronts by quantification, that permit further detailed analysis of the measurement results. The results can be used to improve both of product development or quality control.

Product name Display items Analyzed pixels Other functions

Fringe Analysis System A1

P-V
RMS
bird’s eye view
contour map
sectional profiles
histogram
Seidel aberrations
Zernike polynomials (till the tenth-order aberration)

256 × 256
512 × 512

Data save
P/F judgments’
plural masks
code V*1 output
data substraction

*1 Code V is the trademark of Optical Research Associates.