FUJIFILM Launches “FUJIFILM Prescale Station A3” 

TOKYO, July 22, 2026 – FUJIFILM Corporation announces the launch of “FUJIFILM Prescale Station A3” (“Prescale Station A3”), an A3-size model of “FUJIFILM Prescale Station,” a dedicated pressure image analysis system for “Prescale”^*1 pressure measurement film. “Prescale Station A3” will be available from July 22, 2026. By adding the new A3 model to the lineup, Fujifilm will be able to support pressure inspections across a wider range of sizes, together with the existing A4-size model. “Prescale Station A3” will help improve pressure inspection efficiency and strengthen quality control across a broad range of manufacturing processes, including those in the semiconductor and electronic components industries, as well as the automotive and battery industries.

“Prescale” is a film that visualizes the balance and distribution of contact pressure and surface pressure between objects, and Fujifilm holds a leading global market share for this product. When pressure is applied, the film turns red, and the density of the color visually indicates the magnitude of the pressure.
“Prescale Station” is a system that quantifies pressure by capturing the color patterns developed on “Prescale” film using a high-resolution Factory Automation (FA) camera^*2. It enables users to analyze and save data easily and with high precision, and since its launch last October, “Prescale Station” has contributed to improving the efficiency of pressure testing and strengthening quality control, particularly in the semiconductor and electronic components industries.

In recent years, as manufacturing processes have become more sophisticated and demand for quality assurance and traceability has increased, pressure inspection has become increasingly important in various manufacturing processes. In the semiconductor field in particular, requirements for accurate and stable bonding and sealing have become more stringent in wafer bonding processes, where wafers and chips are bonded, and in packaging processes, where completed chips are protected and mounted.
“Prescale Station A3” is capable of analyzing images of “Prescale” film used to measure the surface pressure of 12-inch (300 mm) wafers, which are currently widely used in semiconductor manufacturing. “Prescale Station A3” also supports the capture of wafer-shaped “Round Prescale”^*3, which was launched in June this year. It captures the developed “Prescale” image using a built-in high-resolution FA camera and LED lighting, and efficiently analyzes and stores pressure data by combining Fujifilm’s advanced image processing and optical technologies. In addition, its automatic pass/fail judgment function, based on customers’ own inspection criteria, integrates the processes of capture, analysis, judgment, and recording. This contributes to reduced equipment maintenance time and improved quality in high-volume production processes at manufacturing sites. Fujifilm will continue to add functions and provide software updates in response to customer needs, supporting inspection operations at manufacturing sites by enabling more advanced analysis and improved usability.

Fujifilm will continue to leverage the technologies it has developed over the years to support the creation of high-precision, efficient inspection workflows on the manufacturing floor and to promote the digitization of operations, thereby contributing to improved inspection efficiency and strengthened quality control at our customers’ manufacturing sites.

• *1 Film that utilizes Fujifilm’s precision coating technology and microcapsule technology to easily visualize the balance and distribution of pressure and surface pressure. Recommended usage temperature: 20°C to 35°C.
• *2 Industrial cameras used for image processing and monitoring in manufacturing processes. They handle various applications such as dimensional measurement, defect detection, and barcode reading.
• *3 A round type of “Prescale” designed to match the shape of wafers for pressure inspection in semiconductor manufacturing processes.

“Prescale Station A3” captures the color patterns developed on “Prescale” film with a high-resolution FA camera and enables analysis and storage of pressure data on a PC. With high reading resolution, even subtle pressure distributions can be visualized in detail. “Prescale Station A3” supports pressure inspections up to A3 size and can analyze “Prescale” film used to measure the surface pressure of 12-inch (300 mm) wafers, which are currently widely used in semiconductor manufacturing. Captured images are displayed on a PC as pressure distribution maps, allowing users to check pressure distribution by color and numerical value. “Prescale Station A3” can also display analysis results such as maximum, minimum, and average values, evaluate user-specified areas, and save inspection results. This enables users to evaluate pressure conditions quantitatively with ease. In addition, new functions such as grouping of inspection frames and load-center analysis are scheduled to be added in August 2026 for both the A3 and A4 models.

“Prescale Station A3”’s optical shielding and design ensure a stable reading environment unaffected by lighting conditions. By eliminating the influence of external light, consistent pressure measurement is possible every time. By setting threshold values in advance, the device can automatically judge pass/fail based on set criteria. Up to 35 measurement frames can be automatically assigned within the image, enabling simultaneous analysis of multiple areas. This helps improve the efficiency and standardization of inspection processes while reducing variation caused by human judgment.

Captured images, analysis images, pressure maps, and measurement results can be saved to a PC. This supports inspection history management and the preparation of quality assurance documents, helping to further strengthen quality management systems at manufacturing sites.

• * Please note that the contents including the product availability, specification, prices and contacts in this website are current as of the date of the press announcement and may be subject to change without prior notice.