- Product code
D-1611
- Panel
amorphous silicon
- Scintillator
Gd2O2S:Tb
- Active area
409.6mm×409.6mm
- Pixel matrix
4096×4096
- Pixel pitch
100μm pixel pitch
- Frame rate
3.75FPS
- Energy duration
40KeV - 15MeV
- Dynamic range
>84 dB
- ADC
16bit
- Data Interface
Fiber-optical interface
- Size
672mm×599mm×44mm
- Weight
25kg
- Operating temperature
10℃～35℃
- Storage temperature
-10℃～50℃
- Humidity
30%～70%（RH）,Non-condensing
- Power supply
EPS power supply 215W
- Dissipation
90W
Canada
Digital Detector Array
DynamIx FXR, FXR Pad - Specifications
100 μm pitch resolution exposure and excellent productivity for conducting a large number of tests.
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Non-destructive testing (NDT) is an application of industrial radiography that uses X-rays to reveal defects in manufactured products or structures -
Conventional X-Ray
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Industrial X-ray film for non-destructive testing applications.
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Computed Radiography System
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CR system offering high-resolution readings from 25 μm pitch to 100 μm pitch.
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Chemistry
Full array of film processing chemicals.
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![[photo] Diagnostic imaging software on a computer monitor](https://asset.fujifilm.com/www/ca/files/2020-06/78a5941a2fd160e4bf8cb2cf82ce79e4/thumb01.jpg)
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